Ludhiana, February 9
A computer learning institute honoured merit holders of the sixth open mathematics test held at Ludhiana Club here yesterday. The test was organised at Guru Nanak Public School on November 9, 2003, in which more than 1,100 students from 35 reputed city schools participated.
Dr R.S. Seehra, Director, Institute of Engineering and Technology, Bhaddal, Ropar, was the chief guest. Dr H.S. Sekhon, Dean, College of Agricultural Engineering, Punjab Agricultural University, was the guest of honour.
On the occasion Kechit Goyal of DAV Public School was declared Wizard 2003 and awarded a gold medal along with a colour TV. Harpreet Singh of Guru Nanak International Public School was declared Genius 2003 and awarded a silver medal along with a BPL stereo. Amandeep Jindal of DAV Public School won the title of Ace 2003 along with a bronze medal and a camera.
Besides, 15 top students were awarded trophies and gifts by leading industrial houses of the city. In addition, 270 rank holders were awarded merit certificates.
Trophies and sponsored gifts were given to three toppers of the schools affiliated with the Punjab School Education Board. In this category Anurag Sharma of New SMD Senior Secondary School, Shivaji Nagar, was declared first, Ajay Dhingra of St Bawra Public High School was the first runner-up and Himanshu Vashisht of Saraswati Modern School second runner-up.
The toppers from class IX were Karmandeep Singh of DAV Public School, Harbir Singh of Radha Vatika Senior Secondary School, Khanna, Vinay Garg of Tagore Public School, and Harvijay Singh of DAV Public School. They were awarded trophies and gifts. An inter-school solo dance competition was also organised in which 27 students from 15 schools participated. Popular songs, skits and dances were presented by the students of the centre. A quiz session was also organised on the occasion.
Ms Rima Juneja, vice-president, operations, of the centre, said the test was aimed at providing the students a platform to test their mental prowess and an insight into the pattern of competitive examinations.